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Scanning electron microscope Product List and Ranking from 16 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

Scanning electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ジャスコインタナショナル 第二事業部 Tokyo//others
  3. アイテス Shiga//Electronic Components and Semiconductors
  4. 4 スペリア Yamagata//Machine elements and parts
  5. 5 KRI Kyoto//Testing, Analysis and Measurement
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Scanning electron microscope Product ranking

Last Updated： Aggregation Period:Feb 04, 2026～Mar 03, 2026
This ranking is based on the number of page views on our site.

  1. Tabletop Scanning Electron Microscope 'Phenom ProX' ジャスコインタナショナル 第二事業部
  2. [Slice&View] Three-Dimensional SEM Observation Method 一般財団法人材料科学技術振興財団　MST
  3. Differences in appearance due to SEM observation conditions アイテス
  4. [Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM 一般財団法人材料科学技術振興財団　MST
  5. 4 Accelerating development through "visualization" inside the battery. KRI

Scanning electron microscope Product List

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Tabletop Scanning Electron Microscope 'Phenom Pharos'

Tabletop Scanning Electron Microscope 'Phenom Pharos'

Even more beautiful with the FE electron gun! Achieving high resolution close to floor models with a tabletop SEM.

We would like to introduce the tabletop scanning electron microscope 'Phenom Pharos' that we handle. It enables analysis at the nano to sub-micron level. Anyone can easily and quickly perform high-resolution observations. Additionally, it is also possible to measure 3D structures, particles, and pores. Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with FE electron gun ■ Easy and speedy high-resolution observation for anyone ■ Observation + α (3D, particles, pores, fibers) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes
  • Scanning electron microscope

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we answer our customers' questions using various tools such as electron microscopes and component analysis devices. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

  • others
  • Scanning electron microscope

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Differences in appearance due to SEM observation conditions

Differences in appearance due to SEM observation conditions

Introducing SEM images taken under various conditions! An explanation of the differences in appearance based on SEM observation conditions.

SEM observation involves detecting secondary electrons and backscattered electrons generated when electrons irradiate the surface of the sample and scatter in the outermost layer of the sample. These are captured by a detector and displayed as an image on a monitor. There are various types of detectors for capturing electrons, each producing images that leverage their unique characteristics, and the appearance can change by varying the acceleration voltage. In this document, we introduce SEM images captured under various conditions. We encourage you to read it. [Contents] ■ Backscattered Electron Images - Backscattered electron images at high acceleration voltage (AsB detector) - Backscattered electron images at low acceleration voltage (EsB detector) ■ Secondary Electron Images - Differences in appearance based on acceleration voltage - Differences in appearance based on detector position *For more details, please refer to the PDF document or feel free to contact us.

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  • Other contract services
  • Scanning electron microscope

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FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis can be performed even at low acceleration voltages. 【Features】 ■ High-brightness electron gun for detailed SEM images ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained from two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without deposition *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Other contract services
  • Scanning electron microscope

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[Slice&View] Three-Dimensional SEM Observation Method

[Slice&View] Three-Dimensional SEM Observation Method

By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.

Using a high-resolution SEM device equipped with FIB, we can obtain three-dimensional structural information by repeatedly performing cross-sectioning (Slice) with FIB and observing (View) with SEM, and then reconstructing the acquired images. Similarly, Slice & View is also possible for SIM (Scanning Ion Microscope) images. - It is possible to observe secondary electron (SE), backscattered electron (BSE) images, and scanning ion microscope (SIM) images.

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection
  • Scanning electron microscope

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[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms

[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms

Applying FIB processing technology, the entire interface of enamel/dental adhesive is observed.

In dental caries treatment, adhesives are used to integrate the filling material used to fill the "cavity" with the tooth structure. The adhesive must have a strong bonding strength with the tooth and the ability to withstand acids and heat that may occur in the oral cavity over a long period after treatment. Observing the adhesive interface is an effective means for evaluation and consideration. By using a manufacturing method that employs FIB processing technology, we were able to achieve effective results that could not be obtained with conventional ultra-thin sections made with diamond knives, and we would like to introduce this.

  • Contract Analysis
  • Scanning electron microscope

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[Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM

[Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM

Evaluation of separator structure by ultra-low acceleration SEM observation.

As exemplified by the separators used in lithium-ion secondary batteries, the microstructure of materials, such as porosity and shape, significantly influences the characteristics and functions of products. When materials have a low softening point, such as resins or polypropylene (PP), they may be damaged by electron beam irradiation during observation, leading to changes in their original structure. We will present a case where ultra-low acceleration SEM observation at an acceleration voltage of 0.1 kV was used to suppress alteration and evaluate the surface morphology of the sample in detail.

  • Contract Analysis
  • Scanning electron microscope

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[Analysis Case] Cell Cycle Assessment from Bacterial Images

[Analysis Case] Cell Cycle Assessment from Bacterial Images

By using deep learning and data analysis, we can evaluate sample characteristics by utilizing large amounts of data.

We observed a sample mixed with three types of lactic acid bacteria using SEM, and extracted the bacteria by type using deep learning from the obtained images. Furthermore, we conducted data analysis to determine the presence ratio on the cell cycle based on the shape of the lactic acid bacteria. Measurement methods: SEM, computational science, AI, data analysis Product fields: Biotechnology, pharmaceuticals, daily necessities, cosmetics, food Analysis purpose: Shape evaluation, product investigation For more details, please download the materials or contact us.

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  • Contract Analysis
  • Contract measurement
  • Scanning electron microscope

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FE-SEM (with EDS/EBSD observation)

FE-SEM (with EDS/EBSD observation)

A finely focused electron beam is irradiated onto the sample! An electron microscope that can also analyze crystal orientation and crystal structure!

The "FE-SEM (Field Emission Scanning Electron Microscope)" is a device that irradiates and scans a finely focused electron beam onto a sample, allowing for clearer magnified images compared to general-purpose SEMs. Additionally, by utilizing a finely focused strong electron beam and employing the Electron Back-Scatter Diffraction (EBSD) method, it is possible to analyze crystal orientation and crystal structure. 【Applicable Targets】 ■ General metal materials ■ Ceramics ■ Fibers (requires deposition treatment) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Electron microscope
  • Scanning electron microscope

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[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

Black foreign substances scattered from the unit cooler! Introduction of a case where the trouble was successfully resolved.

We received a request to investigate the "black foreign substances" being dispersed from the unit cooler in the factory. 【Case】 ■Issue - We would like you to investigate the "black foreign substances" being dispersed from the unit cooler. ■Solution - Elemental analysis using "Scanning Electron Microscopy - Energy Dispersive X-ray (SEM-EDX)" - Analysis of organic materials using "Fourier Transform Infrared Spectroscopy" and comparison of the surface and cross-section of the foreign substances.

  • Contract measurement
  • Contract Inspection
  • Contract Analysis
  • Scanning electron microscope

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Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Introduction to observation and evaluation analysis of low vacuum SEM that does not require coating processes such as vacuum deposition!

Our company is engaged in the analysis solutions business. In low vacuum SEM, coating treatments (pre-treatments) such as vacuum deposition are not required for sample preparation. Even for samples such as insulators, semiconductors, and food, after low vacuum SEM observation without coating treatment, they can be used directly for other analyses. [Contents] ■ Overview ■ Analysis Examples ・ Observation and evaluation of adhesive interfaces *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Other services
  • Scanning electron microscope

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JIB-PS500i FIB-SEM system

JIB-PS500i FIB-SEM system

Cutting-edge technologies for sample preparation, observation, and analysis.

Japan Electron Co., Ltd. JIB-PS500i offers three solutions to assist in TEM sample preparation. You can work with a reliable and high-throughput workflow from sample preparation to TEM observation. 〇 Features - The dual-axis tilt cartridge and TEM holder facilitate the link between TEM and FIB. - The cartridge can be easily attached to a dedicated TEM sample holder with one touch. - Accurate and rapid pickup operations are possible. - Seamlessly transition from TEM sample preparation to STEM observation. - The automatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. *For more details, please download the PDF or feel free to contact us.

  • Other physicochemical equipment
  • Scanning electron microscope

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Tabletop Scanning Electron Microscope 'Phenom ProX'

Tabletop Scanning Electron Microscope 'Phenom ProX'

Overwhelming beauty on a large screen! The sample holder can be easily set into the device with a sliding mechanism.

We would like to introduce the tabletop scanning electron microscope 'Phenom ProX' that we handle. Equipped with a high-brightness, long-life CeB6 electron gun. It displays SEM images just 30 seconds after sample introduction, allowing for barrier-free analysis right away. Additionally, it is resistant to vibrations and offers a resolution of 6nm anywhere. Please feel free to contact us if you have any inquiries. 【Features】 ■ Equipped with a high-brightness, long-life CeB6 electron gun ■ Stunning beauty displayed on a large screen ■ Vibration-resistant with a resolution of 6nm anywhere ■ Innovative user interface ■ SEM image displayed in 30 seconds, analysis completed in 3 minutes *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes
  • Scanning electron microscope

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Contract observation using an electron microscope.

Contract observation using an electron microscope.

We offer surface observation using a scanning electron microscope (FE-SEM): Resolution (sensitivity, etc.): up to 200,000 times.

■Once you send us the sample, we will create a sample stage, take images, and convert them into image files (jpeg) before sending them back to you. ■We have set a low price, so please take advantage of it.

  • Contract measurement
  • Scanning electron microscope

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CD-SEM

CD-SEM

CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.

【Equipment Modification】 ■ Sale of refurbished used equipment ■ Modification for small diameter and compound wafers ■ SMIF to open cassette modification ■ Modification for multiple wafer types (using tray) 【Regular Maintenance】 ■ Chip replacement 【Relocation Services】 ■ In-house relocation ■ Factory relocation 【Troubleshooting】

  • Semiconductor inspection/test equipment
  • Scanning electron microscope

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[Analysis Case] Extraction of Active Material from Battery Cathode Material and Data Analysis

[Analysis Case] Extraction of Active Material from Battery Cathode Material and Data Analysis

We determined the particle size of active substances from SEM images using deep learning and data analysis.

Deep learning enables the extraction of target objects from images. Additionally, by analyzing the regions corresponding to the obtained targets, information can be obtained in numerical form. In this instance, we used deep learning to extract active material particles and detect cracks in cross-sectional SEM images of battery cathode materials. Extraction is also possible for 3D data, such as Slice&View data. We extracted particles with and without cracks from the 3D data and calculated their respective particle sizes. Measurement methods: SEM, Slice&View, computational science, AI, data analysis Product fields: Solar cells, secondary batteries, fuel cells Analysis purposes: Structural evaluation, shape evaluation, failure analysis, defect analysis For more details, please download the materials or contact us.

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  • Contract Analysis
  • Contract measurement
  • Scanning electron microscope

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[Analysis Case] Composition Analysis of Particles on a Wafer

[Analysis Case] Composition Analysis of Particles on a Wafer

Shape observation and simple quantitative analysis using SEM-EDX.

Control of particles in the semiconductor wafer manufacturing process is extremely important for ensuring wafer quality. In this case study, we estimated what the particles were on a Si wafer through SEM observation, EDX analysis, and simple quantification. The SEM equipment, which has high spatial resolution in the submicron range and can scan areas of several centimeters, allows for rapid inference of what the particles on the wafer are based on shape and composition information, enabling quick identification of the generation process. Analysis linked to coordinate data from defect inspection equipment is also possible.

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  • Contract Inspection
  • Wafer
  • Other semiconductor manufacturing equipment
  • Scanning electron microscope

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Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

Collection of Case Studies on Cross-Section Observation and Structural Analysis (e.g., FE-SEM/EBSD) 2

We will introduce various cases of micro-section machining and analysis, residual stress measurement, and more using ion milling, FE-SEM, EBSD, etc. The materials are available for download.

In this case study collection, we will introduce examples related to "cross-sectional observation and structural analysis." Starting with the analysis case of "Evaluation of aluminum sputter films using EBSD," we also include numerous examples such as the purpose, methods, samples, and results of "Cross-sectional processing of micro areas by ion milling," and the purpose, methods, and results of "Residual stress measurement of solder cross-sections." Additionally, we present orientation evaluations, cross-sectional observation results, and measurements. We encourage you to read through it. 【Contents】 ■ Evaluation of aluminum sputter films using EBSD ■ Cross-sectional processing of micro areas by ion milling ■ Residual stress measurement of solder cross-sections ■ Residual stress measurement of wire ■ Cooling (cryo) ion milling cross-sectional processing *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Other polymer materials
  • Other metal materials
  • Scanning electron microscope

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Observation of the cutting edge surface of single crystal diamond chips.

Observation of the cutting edge surface of single crystal diamond chips.

Scanning Electron Microscope (SEM) ■Industry: Automotive (Prototype) / Semiconductor / Robotics

The cutting edge surface of single crystal diamond chips was observed using a scanning electron microscope (SEM). The cutting edge surface of PCD (polycrystalline diamond) was also observed and compared. The differences in the fine surface roughness were clearly confirmed. How this difference affects the machining process is yet to be determined. *For more details, please refer to the PDF document or feel free to contact us.*

  • Other machine elements
  • Processing Contract
  • Scanning electron microscope

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Scanning Electron Microscope (SEM) Observation

Scanning Electron Microscope (SEM) Observation

Observation of non-conductive samples without deposition is possible! Scanning electron microscopy is ideal for surface observation of fibers and similar materials.

A "Scanning Electron Microscope (SEM)" is a device that irradiates and scans a finely focused electron beam on a sample, detects secondary and backscattered electrons, and displays their intensity as an image on a monitor to obtain magnified images of the object. Although it is not suitable for high magnification observation due to reduced image quality, it can use low vacuum mode, allowing for non-coating observation of difficult-to-conduct samples. [Observation Items] ■ Surface observation at magnifications of 5 to 300,000 times ■ Elemental analysis (B to U) using an energy-dispersive X-ray spectrometer (EDS) as an accessory ■ Element identification in micro-regions (qualitative and semi-quantitative analysis) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Scanning electron microscope

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Superior Corporation Business Introduction

Superior Corporation Business Introduction

We are striving for extreme business development in the fields of healthcare and information to meet the social needs of the 21st century!

Superior Co., Ltd. is a company that specializes in the manufacturing of special coils as a professional in precision winding, and also engages in the assembly of machinery, including the assembly of electron microscope units and ultra-precision assembly of semiconductor-related units. Additionally, we accept orders for integrated services from design to manufacturing of resin processing for cleaning tanks used in semiconductor manufacturing equipment and rationalization machinery and equipment. 【Business Activities】 ■ Special coil manufacturing ■ Machinery assembly ■ Resin processing related to industrial machinery ■ Precision parts processing *For more details, please refer to our catalog or feel free to contact us.

  • Inductor Coil
  • Electron microscope
  • Scanning electron microscope

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Tabletop scanning electron microscope

Tabletop scanning electron microscope

Far higher resolution than optical microscopes! Suitable for surface observation and checking surface irregularities at the micro level.

The "Tabletop Scanning Electron Microscope" is a microscope that scans the surface of a sample with a finely focused electron beam in a vacuum, detecting information that comes from the sample and displaying it in an enlarged form. It has a much higher resolution than optical microscopes, making it suitable for surface observation and checking surface irregularities at the micro level. In addition to surface observation, it is also possible to confirm what elements are present on the sample surface and in what quantities through EDS elemental analysis using an X-ray detector. 【Features】 ■ Effective for samples that are difficult to process or that need to be observed as they are ■ Can accommodate samples up to a maximum size of W100mm × D100mm × H40mm on the testing stage ■ By utilizing a user-centric holder, tilting and rotation of the sample is possible ■ Suitable for surface observation and checking surface irregularities at the micro level ■ EDS elemental analysis using an X-ray detector allows for confirmation of what elements are present on the sample surface and in what quantities *For more details, please refer to the PDF document or feel free to contact us.

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  • Electron microscope
  • Scanning electron microscope

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Accelerating development through "visualization" inside the battery.

Accelerating development through "visualization" inside the battery.

Clarifying uncertain phenomena and unknown phenomena in battery development! KRI's one-stop service for secondary batteries.

At our company, battery and system engineers, materials engineers, and analytical engineers collaborate from their respective perspectives to elucidate phenomena and mechanisms. In the fusion technology of operando CT and image analysis (cell thickness and displacement analysis), we acquire three-dimensional images while intermittently and continuously charging and discharging, analyze the images, and evaluate changes. We provide a one-stop solution to clarify uncertain and unknown phenomena in battery development. 【Ultra-high resolution SEM and NMR (partial)】 ■ Potential contrast observation to distinguish materials that are difficult to differentiate through compositional analysis based on differences in conductivity. ■ Observation of sharp fiber shapes without "bulking" due to deposited films. ■ Understanding the bonding state of silane coupling agents chemically bonded to the substrate surface. ■ Observation of intermolecular interactions between phosphine oxide and the substrate. *For more details, please download the PDF or feel free to contact us.

  • Company：KRI
  • Price：Other
  • Technology Development
  • Other analysis and evaluation services
  • Secondary Cells/Batteries
  • Scanning electron microscope

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[Market Report] World Market for Scanning Electron Microscopes

[Market Report] World Market for Scanning Electron Microscopes

The global market for scanning electron microscopes is expected to drive scientific discoveries and experience significant growth.

The global market for scanning electron microscopes (SEM) is at the forefront of scientific exploration, achieving approximately $3.83 billion in revenue in 2022. Industry experts predict that this market will reach $7.84 billion in sales by 2031. This forecast implies a compound annual growth rate (CAGR) of 8.3% during the forecast period from 2023 to 2031. Scanning electron microscopes serve as a window into the microscopic world, revealing complex details of structures and materials that are not visible to the naked eye. From fundamental research to advanced industrial applications, SEMs are essential tools for scientists, engineers, and researchers to unravel minute mysteries. For application methods, please check the [PDF download] button or apply directly through the related links.

  • others
  • Scanning electron microscope

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