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Scanning electron microscope Product List and Ranking from 15 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Scanning electron microscope Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ジャスコインタナショナル 第二事業部 Tokyo//others
  2. アイテス Shiga//Electronic Components and Semiconductors
  3. インターテック販売 東京本社（拠点－関西営業所、熊本営業所） Tokyo//Electronic Components and Semiconductors
  4. 4 null/null
  5. 5 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
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Scanning electron microscope Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Tabletop Scanning Electron Microscope 'Phenom Pharos' ジャスコインタナショナル 第二事業部
  2. FE-SEM observation (Crystal grain observation of Al wire bonding section) アイテス
  3. CD-SEM インターテック販売 東京本社（拠点－関西営業所、熊本営業所）
  4. Tabletop Scanning Electron Microscope 'Phenom ProX' ジャスコインタナショナル 第二事業部
  5. 5 [Case Study] Achieving both High-Resolution Observation and Analysis Functionality with FE-SEM

Scanning electron microscope Product List

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Tabletop Scanning Electron Microscope 'Phenom Pharos'

Tabletop Scanning Electron Microscope 'Phenom Pharos'

Even more beautiful with the FE electron gun! Achieving high resolution close to floor models with a tabletop SEM.

We would like to introduce the tabletop scanning electron microscope 'Phenom Pharos' that we handle. It enables analysis at the nano to sub-micron level. Anyone can easily and quickly perform high-resolution observations. Additionally, it is also possible to measure 3D structures, particles, and pores. Please feel free to contact us if you have any requests. 【Features】 ■ Equipped with FE electron gun ■ Easy and speedy high-resolution observation for anyone ■ Observation + α (3D, particles, pores, fibers) *For more details, please refer to the PDF document or feel free to contact us.

  • Other microscopes

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"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

"Damage analysis" Proven track record of analyzing approximately 3,000 equipment troubles!

By investigating the true cause of the troubles that occurred with the equipment, it becomes possible to formulate effective countermeasures!

By analyzing the damaged areas caused by equipment troubles in detail, we can investigate the true causes of the issues that occurred and propose measures to help prevent recurrence and improve the situation. Utilizing over 40 years of experience and expertise within the Toray Group, we answer our customers' questions using various tools such as electron microscopes and component analysis devices. 【Examples of Analysis Equipment】 ■ Scanning Electron Microscope (SEM) ■ Energy Dispersive X-ray Spectroscopy (EDS) ■ Hardness Tester ■ Various Optical Microscopes, etc.

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Differences in appearance due to SEM observation conditions

Differences in appearance due to SEM observation conditions

Introducing SEM images taken under various conditions! An explanation of the differences in appearance based on SEM observation conditions.

SEM observation involves detecting secondary electrons and backscattered electrons generated when electrons irradiate the surface of the sample and scatter in the outermost layer of the sample. These are captured by a detector and displayed as an image on a monitor. There are various types of detectors for capturing electrons, each producing images that leverage their unique characteristics, and the appearance can change by varying the acceleration voltage. In this document, we introduce SEM images captured under various conditions. We encourage you to read it. [Contents] ■ Backscattered Electron Images - Backscattered electron images at high acceleration voltage (AsB detector) - Backscattered electron images at low acceleration voltage (EsB detector) ■ Secondary Electron Images - Differences in appearance based on acceleration voltage - Differences in appearance based on detector position *For more details, please refer to the PDF document or feel free to contact us.

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FE-SEM observation (Crystal grain observation of Al wire bonding section)

FE-SEM observation (Crystal grain observation of Al wire bonding section)

High-brightness electron gun for detailed SEM images! Equipped with an in-lens SE detector sensitive to surface information.

The ZEISS "FE-SEM ULTRA55" is equipped with a GEMINI column, allowing for high-resolution observation at extremely low acceleration voltages. It also features multiple detectors, enabling the observation of various samples. Composition information can be obtained using two types of backscattered electron detectors, and high-resolution EDX analysis can be performed even at low acceleration voltages. 【Features】 ■ High-brightness electron gun for detailed SEM images ■ Ultra-surface analysis at extremely low acceleration voltages ■ In-lens SE detector sensitive to surface information ■ Composition information obtained from two types of backscattered electron detectors ■ High-resolution EDX analysis even at low acceleration voltages ■ Observation without deposition *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Other contract services

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[Slice&View] Three-Dimensional SEM Observation Method

[Slice&View] Three-Dimensional SEM Observation Method

By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.

Using a high-resolution SEM device equipped with FIB, we can obtain three-dimensional structural information by repeatedly performing cross-sectioning (Slice) with FIB and observing (View) with SEM, and then reconstructing the acquired images. Similarly, Slice & View is also possible for SIM (Scanning Ion Microscope) images. - It is possible to observe secondary electron (SE), backscattered electron (BSE) images, and scanning ion microscope (SIM) images.

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  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms

[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms

Applying FIB processing technology, the entire interface of enamel/dental adhesive is observed.

In dental caries treatment, adhesives are used to integrate the filling material used to fill the "cavity" with the tooth structure. The adhesive must have a strong bonding strength with the tooth and the ability to withstand acids and heat that may occur in the oral cavity over a long period after treatment. Observing the adhesive interface is an effective means for evaluation and consideration. By using a manufacturing method that employs FIB processing technology, we were able to achieve effective results that could not be obtained with conventional ultra-thin sections made with diamond knives, and we would like to introduce this.

  • Contract Analysis

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[Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM

[Analysis Case] Observation of Fine Structures under Ultra-Low Acceleration Voltage Conditions using SEM

Evaluation of separator structure by ultra-low acceleration SEM observation.

As exemplified by the separators used in lithium-ion secondary batteries, the microstructure of materials, such as porosity and shape, significantly influences the characteristics and functions of products. When materials have a low softening point, such as resins or polypropylene (PP), they may be damaged by electron beam irradiation during observation, leading to changes in their original structure. We will present a case where ultra-low acceleration SEM observation at an acceleration voltage of 0.1 kV was used to suppress alteration and evaluate the surface morphology of the sample in detail.

  • Contract Analysis

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[Analysis Case] Cell Cycle Assessment from Bacterial Images

[Analysis Case] Cell Cycle Assessment from Bacterial Images

By using deep learning and data analysis, we can evaluate sample characteristics by utilizing large amounts of data.

We observed a sample mixed with three types of lactic acid bacteria using SEM, and extracted the bacteria by type using deep learning from the obtained images. Furthermore, we conducted data analysis to determine the presence ratio on the cell cycle based on the shape of the lactic acid bacteria. Measurement methods: SEM, computational science, AI, data analysis Product fields: Biotechnology, pharmaceuticals, daily necessities, cosmetics, food Analysis purpose: Shape evaluation, product investigation For more details, please download the materials or contact us.

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  • Contract Analysis
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FE-SEM (with EDS/EBSD observation)

FE-SEM (with EDS/EBSD observation)

A finely focused electron beam is irradiated onto the sample! An electron microscope that can also analyze crystal orientation and crystal structure!

The "FE-SEM (Field Emission Scanning Electron Microscope)" is a device that irradiates and scans a finely focused electron beam onto a sample, allowing for clearer magnified images compared to general-purpose SEMs. Additionally, by utilizing a finely focused strong electron beam and employing the Electron Back-Scatter Diffraction (EBSD) method, it is possible to analyze crystal orientation and crystal structure. 【Applicable Targets】 ■ General metal materials ■ Ceramics ■ Fibers (requires deposition treatment) *For more details, please refer to the catalog or feel free to contact us.

  • Analytical Equipment and Devices
  • Electron microscope

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[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

[Case Study] Incident of "Black Foreign Substance" Dispersing from Unit Cooler

Black foreign substances scattered from the unit cooler! Introduction of a case where the trouble was successfully resolved.

We received a request to investigate the "black foreign substances" being dispersed from the unit cooler in the factory. 【Case】 ■Issue - We would like you to investigate the "black foreign substances" being dispersed from the unit cooler. ■Solution - Elemental analysis using "Scanning Electron Microscopy - Energy Dispersive X-ray (SEM-EDX)" - Analysis of organic materials using "Fourier Transform Infrared Spectroscopy" and comparison of the surface and cross-section of the foreign substances.

  • Contract measurement
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Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Technical Data: Low Vacuum SEM (Observation and Evaluation of Adhesive Interfaces)

Introduction to observation and evaluation analysis of low vacuum SEM that does not require coating processes such as vacuum deposition!

Our company is engaged in the analysis solutions business. In low vacuum SEM, coating treatments (pre-treatments) such as vacuum deposition are not required for sample preparation. Even for samples such as insulators, semiconductors, and food, after low vacuum SEM observation without coating treatment, they can be used directly for other analyses. [Contents] ■ Overview ■ Analysis Examples ・ Observation and evaluation of adhesive interfaces *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
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JIB-PS500i FIB-SEM system

JIB-PS500i FIB-SEM system

Cutting-edge technologies for sample preparation, observation, and analysis.

Japan Electron Co., Ltd. JIB-PS500i offers three solutions to assist in TEM sample preparation. You can work with a reliable and high-throughput workflow from sample preparation to TEM observation. 〇 Features - The dual-axis tilt cartridge and TEM holder facilitate the link between TEM and FIB. - The cartridge can be easily attached to a dedicated TEM sample holder with one touch. - Accurate and rapid pickup operations are possible. - Seamlessly transition from TEM sample preparation to STEM observation. - The automatic TEM sample preparation system STEMPLING2 automates TEM sample preparation. *For more details, please download the PDF or feel free to contact us.

  • Other physicochemical equipment

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Tabletop Scanning Electron Microscope 'Phenom ProX'

Tabletop Scanning Electron Microscope 'Phenom ProX'

Overwhelming beauty on a large screen! The sample holder can be easily set into the device with a sliding mechanism.

We would like to introduce the tabletop scanning electron microscope 'Phenom ProX' that we handle. Equipped with a high-brightness, long-life CeB6 electron gun. It displays SEM images just 30 seconds after sample introduction, allowing for barrier-free analysis right away. Additionally, it is resistant to vibrations and offers a resolution of 6nm anywhere. Please feel free to contact us if you have any inquiries. 【Features】 ■ Equipped with a high-brightness, long-life CeB6 electron gun ■ Stunning beauty displayed on a large screen ■ Vibration-resistant with a resolution of 6nm anywhere ■ Innovative user interface ■ SEM image displayed in 30 seconds, analysis completed in 3 minutes *For more details, please refer to the PDF materials or feel free to contact us.

  • Other microscopes

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Contract observation using an electron microscope.

Contract observation using an electron microscope.

We offer surface observation using a scanning electron microscope (FE-SEM): Resolution (sensitivity, etc.): up to 200,000 times.

■Once you send us the sample, we will create a sample stage, take images, and convert them into image files (jpeg) before sending them back to you. ■We have set a low price, so please take advantage of it.

  • Contract measurement

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CD-SEM

CD-SEM

CDSEM, boasting an overwhelming market share, along with the Hitachi S8000 and S9000 series. We have a constant inventory of equipment and a complete demonstration system in place.

【Equipment Modification】 ■ Sale of refurbished used equipment ■ Modification for small diameter and compound wafers ■ SMIF to open cassette modification ■ Modification for multiple wafer types (using tray) 【Regular Maintenance】 ■ Chip replacement 【Relocation Services】 ■ In-house relocation ■ Factory relocation 【Troubleshooting】

  • Semiconductor inspection/test equipment

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